Optics: measuring and testing – By dispersed light spectroscopy – With synchronized spectrum repetitive scanning
Patent
1978-12-11
1980-12-30
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
With synchronized spectrum repetitive scanning
356323, 356326, 356243, G01J 334
Patent
active
042419972
ABSTRACT:
A laser beam from a tunable laser is split into two paths containing an etalon and a sample cell respectively. The two paths are chopped at different frequencies. The paths are combined and fed to a monochromator and then detected by a single detector. Lock-in amplifiers tuned to the chopper frequencies and responsive to the detector output produce signals corresponding to the spectra arising from the etalon and the sample gas absorption. A recorder simultaneously displays the two spectra.
REFERENCES:
patent: 3521959 (1970-07-01), Treharne
"Wavenumber Calibration of Tunable Diode Lasers Using Etalons", Flicker et al, Applied Optics, vol. 17, No. 6, Mar. 15, 1978, pp. 851-852.
General Motors Corporation
Hill Warren D.
McGraw Vincent P.
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