Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Reexamination Certificate
2003-02-10
2008-03-18
Estrada, Michelle (Department: 2823)
Semiconductor device manufacturing: process
With measuring or testing
Optical characteristic sensed
C438S007000, C257SE21237, C428S209000, C428S069000, C216S004000
Reexamination Certificate
active
07344900
ABSTRACT:
Disclosed are a semiconductor wafer (10) having a front side laser scribe (22) and the methods for manufacturing the same. The methods of the invention include the formation of a scribe foundation (12) on the front side of the semiconductor wafer (10) designed to accept laser scribing (22), and laser scribing the scribe foundation (12). Disclosed embodiments include a semiconductor wafer (10) having a scribe foundation (12) of layered dielectric (30) and metal (34) on the front side. According to disclosed embodiments of the invention, the formation of a scribe foundation (12) is performed in combination with the formation of a top level metal layer (34) on the semiconductor wafer (10) methods for manufacturing.
REFERENCES:
patent: 4825093 (1989-04-01), Kiriseko et al.
patent: 5777743 (1998-07-01), Bacchi et al.
patent: 2002/0031899 (2002-03-01), Manor
Brady III W. James
Estrada Michelle
Garner Jacqueline J.
Stark Jarret J
Telecky , Jr. Frederick J.
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