Optics: measuring and testing – Refraction testing – Schlieren effect
Patent
1985-02-28
1987-07-21
Rosenberger, R. A.
Optics: measuring and testing
Refraction testing
Schlieren effect
356128, G01N 2141
Patent
active
046814370
ABSTRACT:
A system and method for monitoring the state of a crystal (C) which is suspended in a solution is disclosed which includes providing a light source (10) for emitting a beam (12) of light along an optical axis (X). A collimating lens is arranged along the optical axis for collimating the emitted beam to provide a first collimated light beam (16) consisting of parallel light rays. The solution and crystal are contained in a transparent container (18). By passing the first collimated light beam through the container, a number of the parallel light rays are deflected off of the surfaces of said crystal being monitored according to the refractive index gradient to provide a deflected beam (19) of deflected light rays. A focusing lens (22) is arranged along the optical axis for focusing the deflected rays (32, 34, 48, 50) towards a desired focal point (24a). A knife edge (24) is arranged in a predetermined orientation at the focal point; and a screen (26) is provided. A portion (34, 50) of the deflected beam is blocked with the knife edge to project only a portion (32, 48) of the deflected beam (19). A band (38) is created at one edge of the image of the crystal which indicates the state of change of the surface (39a, 39b) of the crystal (C) being monitored.
REFERENCES:
patent: 2777355 (1957-01-01), Lindsey
patent: 2805599 (1957-09-01), Pajes
patent: 4391518 (1983-07-01), Owen et al.
patent: 4547071 (1985-10-01), Teitelbaum
Johnston Mary H.
Owen Robert B.
Beumer Joseph H.
Cooper Crystal D.
Manning John R.
Rosenberger R. A.
The United States of America as represented by the Administrator
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