Laser scanning microscope

Details Laser scanning microscope Laser scanning microscope

2005-08-09

2005-08-09

Robinson, Mark A. (Department: 2872)

Optical: systems and elements

Compound lens system

Microscope

C250S201300

Reexamination Certificate

active

06927902

ABSTRACT:
In a laser scanning microscope comprising a deflecting device, which is provided for variable deflection of a laser beam about a deflection angle, and a control unit, which controls the deflecting device via a control signal and measures, at least temporarily, a present deflection angle value, it is envisaged that, at the time of measurement of the present deflection angle value, a testing structure, which comprises at least one structural element whose position is assigned to a predetermined deflection angle value, is arranged downstream of the deflecting device, a detecting device is provided, which emits a detection signal when the laser beam is directed to the structural element, and the control unit assigns the present control signal to the predetermined deflection angle value upon reception of the detection signal.

REFERENCES:
patent: 6037583 (2000-03-01), Moehler
patent: 6355919 (2002-03-01), Engelhardt
patent: 6677579 (2004-01-01), Engelhardt
patent: 197 32 668 (1999-02-01), None
patent: 199 06 763 (2000-08-01), None

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