Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate
2005-11-08
2005-11-08
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
C359S385000, C359S368000, C250S462100
Reexamination Certificate
active
06963398
ABSTRACT:
The laser scanning microscope comprises an objective focusing a laser beam on a sample, and takes fluorescence or reflected light from the sample, optical scanning means for scanning the laser beam on the sample two-dimensionally, an acousto-optic device, arranged on an optical path of a fluorescence or a reflected light, which selects and deflects only a light beam with the wavelength which corresponds to incident fluorescence or the reflected light and a frequency of the applied high frequency voltage, optical detection means for detecting a light beam through the acousto-optic device, and frequency scanning means for switching and setting a frequency of a high frequency voltage applied to the acousto-optic device.
REFERENCES:
patent: 5377003 (1994-12-01), Lewis et al.
patent: 5528368 (1996-06-01), Lewis et al.
patent: 5784162 (1998-07-01), Cabib et al.
patent: 5841577 (1998-11-01), Wachman et al.
patent: 6167173 (2000-12-01), Schoeppe et al.
patent: 6433929 (2002-08-01), Sasaki
patent: 6525812 (2003-02-01), Hartmann et al.
patent: 6686583 (2004-02-01), Engelhardt
patent: 6717723 (2004-04-01), Arai
patent: 2000-056244 (2000-02-01), None
patent: 2001-124997 (2001-05-01), None
patent: WO 99/42884 (1999-08-01), None
Kitagawa Junichi
Sasaki Hiroshi
Frishauf Holtz Goodman & Chick P.C.
Lauchman Layla G.
Olympus Optical Co,. Ltd.
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