Image analysis – Histogram processing – For setting a threshold
Patent
1991-12-19
1993-05-04
Gregory, Bernarr E.
Image analysis
Histogram processing
For setting a threshold
738655, 2502222, 356338, G01V 904
Patent
active
H00011835
ABSTRACT:
A method for counting the number and measuring the area of solid particles ranging in size from one micron to one millimeter across contained in a sample of a solids-loaded plastic matrix material. The method utilizes an interfacing electronics package to place a laser scanner under computer control.
REFERENCES:
patent: 3805028 (1974-04-01), Morton
patent: 4183013 (1980-01-01), Agrawala et al.
patent: 4189711 (1980-02-01), Frank
patent: 4624013 (1986-11-01), Urushibata
patent: 4630306 (1986-12-01), West et al.
patent: 4791676 (1988-12-01), Flickner et al.
National Bureau of Standards Special Publication 400-24 entitled Semiconductor Measurement Technology: A Laser Scanner for Semiconductor Devices, by David E. Sawyer and David W. Berning, issued in Feb. of 1977.
Chandler, conservator by Hana A.
Crispin Kevin W. R.
Smith Jack S.
Zitko Frank
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