Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1986-03-27
1987-11-10
Willis, David L.
Optics: measuring and testing
By particle light scattering
With photocell detection
307427, 356346, G01B 902, G01J 345
Patent
active
047053976
ABSTRACT:
A laser pulse train jitter measuring device includes a first optical path having a length set at a first value or a second value and a second optical path having a length variable between a first value and a second value. A laser beam is split into a first beam directed to the first optical path and a second beam directed to the second optical path. The split beams are recombined into a correlated beam and recorded as visible images so that jitter in the laser beam can be detected from the differences in the recordings when the first optical path has its first length while the second optical path is varied between the first value and the second value from when the first optical path has its second length while the second optical path is varied between the first value and the second value.
REFERENCES:
patent: 4406542 (1983-09-01), Boggy et al.
Shah et al., "Interferometric Studies of Mode-Locked Nd.sup.3+ : Gloss Lasers", IEEE J. Quant. Elec., vol. QE-11, No. 9, pp. 783-788, 9/75.
Fork et al., "Real-Time Intensity Interferometer", Applied Optics, vol. 17, No. 22, pp. 3534-3535, 11/78.
Harde, et al., "Rapid Scanning Autocorrelator for Measurements of Picosecond Laser Pulses", Optics Communications, vol.-38, No.-3, pp. 211-216, 8/81.
Aoshima Shinichirou
Takeshima Akira
Tsuchiya Yutaka
Hamamatsu Photonics Kabushiki Kaisha
Koren Matthew W.
Willis David L.
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