Laser production and product qualification via accelerated...

Details Laser production and product qualification via accelerated... Laser production and product qualification via accelerated...

2006-03-28

2006-03-28

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07019548

ABSTRACT:
A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures and wafer qualification, are optimized with reduced cost and effort. The method is also used to improve maintenance of optical networks containing semiconductor lasers.

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ews
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