Laser processing method and chip

Semiconductor device manufacturing: process – Semiconductor substrate dicing – By electromagnetic irradiation

Reexamination Certificate

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C257SE21237

Reexamination Certificate

active

08043941

ABSTRACT:
An object to be processed can be cut highly accurately along a line to cut.An object to be processed1is irradiated with laser light while locating a converging point within a silicon wafer11, and the converging point is relatively moved along a line to cut5, so as to form modified regions M1, M2positioned within the object1along the line to cut5, and then a modified region M3positioned between the modified regions M1, M2within the object1.

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