Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1986-09-08
1988-03-29
LaRoche, Eugene R.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 4, G01C 308
Patent
active
047339691
ABSTRACT:
A laser based optically triggered sensor system is described which can function as a coordinate measuring machine (CMM) probe. With the sensor, a CMM can find the exact location of the surface of a test object without physically having to touch the object. The reflectivity of the laser beam is sensed by a detector pair. The ratio of light on the detector pair is sensed and used to indicate when the probe is in range for a measurement, out of range for the measurement, and when in range, whether the object being sensed is too far or too close from the trigger point of the probe. The system is a plug compatible replacement for existing contact trigger probes currently used on most CMM's.
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Case Steven K.
Keil Robert E.
Konicek John
CyberOptics Corporation
LaRoche Eugene R.
Pascal Robert J.
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