Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate
2006-06-27
2008-10-21
Toatley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
C356S318000, C356S626000
Reexamination Certificate
active
07440097
ABSTRACT:
An in-situ laser plasma spectroscopy (LPS) system for automated near real-time elemental depth profiling of a target including: an optical source configured to generate an optical beam, wherein the optical beam is pulsed; an optical probe system configured to deliver the optical beam from the optical source to a surface of a target to generate an ablation plasma; a time resolved spectral detection system configured to generate time resolved spectral data from emission signals from the ablation plasma; and a data acquisition and processing system configured to acquire the time resolved spectral data to determine, in combination with predetermined calibration data, an absolute elemental concentration as a function of depth in near real-time.
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Benicewicz Pamela King
Fomitchov Pavel Alexeyevich
Rozier Elena
Schumaker Tymm Bradner
Viertl John Ruediger Mader
Agosti Ann M.
General Electric Company
Giglio Bryan
Toatley Jr. Gregory J
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