Laser monitoring using both the reflected and transmitted...

Details Laser monitoring using both the reflected and transmitted... Laser monitoring using both the reflected and transmitted...

2006-05-09

2006-05-09

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By light interference

Having partially reflecting plates in series

C356S454000

Reexamination Certificate

active

07042579

ABSTRACT:
A laser signal is monitored. The laser signal is forwarded to an etalon. Light transmitted through the etalon is detected. Light reflected from the etalon is detected. A ratio is calculated from the detected light transmitted through the etalon and the light reflected from the etalon.

REFERENCES:
patent: 6259712 (2001-07-01), DeCain et al.
patent: 6421120 (2002-07-01), Wildnauer
patent: 6714309 (2004-03-01), May
patent: 6885462 (2005-04-01), Lee et al.

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