Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate
2011-06-28
2011-06-28
Nguyen, Thong (Department: 2872)
Optical: systems and elements
Compound lens system
Microscope
C359S368000, C359S385000
Reexamination Certificate
active
07969653
ABSTRACT:
It is possible to achieve a required field number and numerical aperture for microscope observation at a scanning speed equal to video-rate or higher and also to change the scanning speed with a simple configuration. The invention provides a laser microscope including a laser light source; a scanning unit configured to scan a specimen with laser light emitted from the laser light source; and an objective lens configured to focus the laser light scanned by the scanning unit on the specimen. The scanning unit is provided with an electro-optical deflecting element including an electro-optical crystal in which a refractive index gradient is induced by injecting electric current.
REFERENCES:
patent: 3429641 (1969-02-01), Fowler
patent: 3531179 (1970-09-01), Sliker et al.
patent: 3938878 (1976-02-01), Fox
patent: 4428873 (1984-01-01), Murayama et al.
patent: 5451977 (1995-09-01), Kusuda et al.
patent: 5936764 (1999-08-01), Kobayashi
patent: 6859467 (2005-02-01), Adams et al.
patent: 2004/0196549 (2004-10-01), Aono
patent: 2005/0068645 (2005-03-01), Nagaeda
patent: 60-181718 (1985-09-01), None
patent: 8-327936 (1996-12-01), None
patent: 10-288798 (1998-10-01), None
patent: 2005-55745 (2005-03-01), None
patent: WO 03/046613 (2003-06-01), None
patent: WO-03/046897 (2003-06-01), None
European Patent Office Communication dated Jun. 6, 2009 (4 pages), issued in counterpart European Application Serial No. 07 024 561.8.
K. Nakamura et al; Applied Physics Letters 89, 2006; Wide-Angle, Low-Voltage Electro-Optic Beam Deflection Based on Space-Charge-Controlled Mode of Electrical Conduction . . . ; 3 pages.
Extended European Search Report dated Apr. 25, 2008, issued in a counterpart European Application.
Araya Akinori
Nakata Tatsuo
Ueno Makio
Holtz Holtz Goodman & Chick PC
Nguyen Thong
Olympus Corporation
LandOfFree
Laser microscope and control method for the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Laser microscope and control method for the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Laser microscope and control method for the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2661398