Laser metrology system and method

Details Laser metrology system and method Laser metrology system and method

2011-01-25

2011-01-25

Chowdhury, Tarifur (Department: 2886)

Optics: measuring and testing

Position or displacement

Reexamination Certificate

active

07876457

ABSTRACT:
A laser metrology system for determining a location of a target utilizes a laser projector having a laser source for projecting a laser beam. A rotating head directs the laser beam in a lateral direction. A sensor associated with the laser projector is capable of sensing the laser beam. A reflective target is configured to reflect the laser beam projector from the laser source toward the sensor in a manner indicative of the angle of the rotating head and the pulse of the laser beam to determine location of the target.

REFERENCES:
patent: 5894123 (1999-04-01), Ohtomo et al.
patent: 6501543 (2002-12-01), Hedges et al.
patent: 6535282 (2003-03-01), Hedges et al.

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