Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1977-07-27
1979-06-19
Corbin, John K.
Optics: measuring and testing
By polarized light examination
With light attenuation
250237G, 356371, G01B 1124
Patent
active
041585070
ABSTRACT:
A laser measuring system for industrial inspection having a laser producing a narrow beam of coherent light which is focused by telescope onto an article. The focused beam of light from the telescope is directed by a scanning means across the article at a known rate. The light reflected from the article is focused by an imaging lens offset from the scanning means onto an optical grating which is provided with alternate transparent and opaque bars. The collected light which passes through the transparent bars of the optical grating is sensed by a photomultiplier detector. A processor which sees the output of the photomultiplier detector determines the time interval between selected points of the output signal of the photomultiplier detector. As the scanning beam moves across the article it causes the laser spot observed by the photomultiplier to traverse the surface faster or slower depending on whether the scanning is proceeding up a portion of the surface of the article or down, respectively. Thus, the reflected light traverses the optical grating at a slower or faster rate and, therefore, the time interval measured by the processor between the selected points on the output of the detector increases as the scanning beam moves up the surface and decreases as the scanning moves down the surface. The processor provides an output directly related to the contour of the article which can be stored and compared with the contour of a master article or prototype.
REFERENCES:
patent: 3364813 (1968-01-01), McKinney
patent: 3573849 (1971-04-01), Herriot et al.
patent: 3975102 (1976-08-01), Rosenfeld et al.
Corbin John K.
Punter Wm. H.
Recognition Equipment Incorporated
Vandigriff John E.
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