Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1980-08-11
1983-11-29
Arnold, Bruce Y.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
33DIG4, 33DIG21, 82 34R, G01B 1110
Patent
active
044178166
ABSTRACT:
A laser measuring system is associated with a two axis turning machine (10), having a tool turret (12), to permit the dimensions of a machined part to be ascertained without removal of the part or workpiece from the chuck (18) of the machine. A gage head (36), which includes a retroflector (40), is mounted upon the turret which is indexible to a measuring station in which part measurements may be taken. The turret is mounted upon an X-axis slide (32) movable perpendicular to the chuck axis which, in turn, is mounted upon a Z-axis slide (26) movable parallel to the chuck axis. An interferometer (48) if fixedly attached to the Z-axis slide so as to be in alignment with the retroflector when the retroflector is in the measuring station. A Laser beam source (52) and a beam receiver (54) are mounted on or adjacent the machine such that they are in proper alignment with the interferometer. A collar (20) on the chuck furnishes a reference surface which functions as a fixed gage calibration point.
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Brien Joseph E.
Kindl George F.
Michaud Orean E.
Arnold Bruce Y.
Colt Industries Operating Corp.
Dornon Richard A.
Luther Radford W.
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