Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1996-09-27
1998-06-23
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With birefringent element
356354, G01B 902
Patent
active
057710988
ABSTRACT:
An interferometric lithographic apparatus includes an arrangement for applying interfering laser beams to a part for producing a first interference pattern. The first interference pattern has a first fringe spacing. A mobile part holder stage is repositioned to change the interference pattern and produce a second fringe spacing. A control arrangement, automatically responsive to the repositioning of the part holder, re-aligns optical paths and optimally interferes the laser beams to produce the second fringe spacing.
Ghosh Amalkumar P.
Jones Gary W.
Jones Susan K. Schwartz
Liu Yachin
Zimmerman Steven M.
FED Corporation
Font Frank G.
Kim Robert
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