Laser interferometer measurement system for use with machine too

Details Laser interferometer measurement system for use with machine too Laser interferometer measurement system for use with machine too

1995-04-28

1999-08-17

Kim, Robert

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356345, G01B 902

Patent

active

059401800

ABSTRACT:
A measurement system for precisely measuring the distance between two points is disclosed. The measurement system includes a laser interferometer assembly having a beam splitter and a first reflector disposed to reflect a laser beam along a linear path. The laser interferometer assembly cooperates with a deadpath elimination cell having a sealed hollow interior region. The hollow interior region is sealed by at least one window disposed at the end of the hollow interior region proximate the first reflector. A second reflector is disposed on the opposite side of the hollow interior region and is oriented to reflect the laser beam back along the linear path. Thus, the volume and quantity of gas within the hollow interior remains constant to increase the accuracy in measuring the distance between the first and second reflectors.

REFERENCES:
patent: Re27051 (1971-02-01), Chappel
patent: 2823591 (1958-02-01), Craddock et al.
patent: 3035482 (1962-05-01), Kinder
patent: 3037286 (1962-06-01), Bower
patent: 3569153 (1971-03-01), Brainard et al.
patent: 3577659 (1971-05-01), Kail
patent: 3661463 (1972-05-01), Brainard et al.
patent: 3683747 (1972-08-01), Pettit
patent: 4280285 (1981-07-01), Haas
patent: 4343610 (1982-08-01), Chou
patent: 4360182 (1982-11-01), Titus
patent: 4364540 (1982-12-01), Montabet
patent: 4377036 (1983-03-01), Dangschat
patent: 4407625 (1983-10-01), Shum
patent: 4512695 (1985-04-01), Brun et al.
patent: 4536690 (1985-08-01), Belsterling et al.
patent: 4556957 (1985-12-01), Ichikawa
patent: 4569627 (1986-02-01), Simunovic
patent: 4576577 (1986-03-01), Lam et al.
patent: 4578763 (1986-03-01), Jones et al.
patent: 4621926 (1986-11-01), Merry et al.
patent: 4643577 (1987-02-01), Roth et al.
patent: 4645084 (1987-02-01), Deike
patent: 4651589 (1987-03-01), Lambert
patent: 4723460 (1988-02-01), Rosheim
patent: 4753596 (1988-06-01), Hart et al.
patent: 4776749 (1988-10-01), Wazenbergt et al.
patent: 4806068 (1989-02-01), Kohli et al.
patent: 4813783 (1989-03-01), Torge
patent: 4819469 (1989-04-01), Shelef
patent: 4988244 (1991-01-01), Sheldon et al.
patent: 5028180 (1991-07-01), Sheldon et al.
patent: 5146284 (1992-09-01), Tabarelli et al.
"Milling With Universal Spindles", F. Mason, American Machinist, Jun. 1989, pp. 53-59.
"A Platform With Six Degrees of Freedom", D. Stewart, The Institute of Mechanical Engineers, Proceedings 1965-66, pp. 371-394.
"Universal Tyre Test Machine", V.E. Gough & S.G. Whiteall Proceedings, Ninth International Technical Congress F.I.S.I.T.A., May 1962, pp. 117-137 .

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