Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1996-01-02
1997-11-25
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356381, 25055919, 25055927, G01B 1102
Patent
active
056918151
ABSTRACT:
A laser inspection tool system (100) includes a hand-held remote tool head (108) that provides an image of a target object (116) and a measurement surface (118). The remote tool head (108) includes light sources (208) and mirrors (210) that in conjunction generate two perpendicular lines of light that impinge the target object (116) and the measurement surface (118) and reflect to a form an image in a camera (218) in the remote tool head (108). The remote tool head (108) may be oriented at any angle relative to the measurement surface (118). A processor (102) remotely coupled to the remote tool head (108) captures the image and determines the offset between the light reflected by the target object (116) and the light reflected by the measurement surface (118), and the angle between the reflected lines of light. Using the offset and the angle, the processor (102) determines the height of the top of the target object (116) above the measurement surface (118) and the angle of the remote tool head (108) relative to the measurement surface (118).
REFERENCES:
patent: 4488172 (1984-12-01), Hutchin
patent: 4573073 (1986-02-01), Corby, Jr.
patent: 4575805 (1986-03-01), Moermann et al.
patent: 4583857 (1986-04-01), Grammerstorff et al.
patent: 4628469 (1986-12-01), White
patent: 4641972 (1987-02-01), Halioua et al.
patent: 4650333 (1987-03-01), Crabb et al.
patent: 4682894 (1987-07-01), Schmidt et al.
patent: 4701047 (1987-10-01), Eibert et al.
patent: 4801207 (1989-01-01), Williams
patent: 4825263 (1989-04-01), Desjardins et al.
patent: 4925308 (1990-05-01), Stern et al.
patent: 4961155 (1990-10-01), Ozeki et al.
patent: 5076697 (1991-12-01), Takagi et al.
patent: 5085502 (1992-02-01), Womack et al.
patent: 5175601 (1992-12-01), Fitts
patent: 5307151 (1994-04-01), Hof et al.
David R. Burton and Michael J. Lawlor, `Multichannel Fourier fringe analysis as an aid to automastic phase unwrapping`, Applied Optics, May 10, 1994, vol. 33, No. 14, U.S.A.
Katherine Creath, `Wyko Systems for Optical Metrology`, 1987 SPIE Proceeding, vol. 816 Interferometric Metrology, U.S.A.
Chris L. Koliopoulos and Mark Jensen, `Real-Time Video Rate Phase Processor`, 1993, pp. 264-268, SPIE vol. 2003, Interferometry VI, U.S.A.
Daniel Malacara, Optical Shop Testing 1992, pp. 668-681, `Moire and Fringe Projection Techniques`, John Wiley & Sons, Inc., U.S.A.
Carolyn R. Mercer and Glenn Beheim, `Fiber-Optic Projected-Fringe Digital Interferometry`, Nov. 4-7, 1990, pp. 1-8, NASA Technical Memorandum 103252 U.S.A.
B.F. Oreb, K.G. Larkin, P. Fairman and M. Ghaffari, `Moire based Optical Surface Profiler for the Minting Industry`, 1992, pp. 48-57, SPIE Proceeding, vol. 1776, U.S.A.
James C. Wyant, `Interferometric Optical Metrology: Basis Principles and New Systems`, May 1982, pp. 65-71, Laser Focus, U.S.A.
Yiping Xu and Chiayu Ai, `Simple and effective phase unwrapping technique`, 1993, pp. 254-263, SPIE, vol. 2003, Interferometry VI, U.S.A.
Huber Edward D.
Reinhart Scott E.
Williams Rick A.
Evans F. L.
Lockheed Missiles & Space Co., Inc.
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