Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent
1993-06-17
1995-12-26
Limanek, Robert P.
Optics: measuring and testing
Inspection of flaws or impurities
Having predetermined light transmission regions
356369, 25055942, 25055948, G01N 2188
Patent
active
054792525
ABSTRACT:
A laser imaging system is used to analyze defects on semiconductor wafers that have been detected by patterned wafer defect detecting systems (wafer scanners). The laser imaging system replaces optical microscope review stations now utilized in the semiconductor fab environment to examine detected optical anomalies that may represent wafer defects. In addition to analyzing defects, the laser imaging system can perform a variety of microscopic inspection functions including defect detection and metrology. The laser imaging system uses confocal laser scanning microscopy techniques, and operates under class 1 cleanroom conditions and without exposure of the wafers to operator contamination or airflow. Unlike scanning electron microscopes (SEMs) that have previously been used for defect analysis, the laser imaging system will not damage samples or slow processing, costs significantly less to implement than an SEM, can produce a three dimensional image which provides quantitative dimensional information, and allows sub-surface viewing of defects lying beneath dielectric layers. The laser imaging system is adaptable to cluster or in-situ applications, where examination of defects or structures during on-line processing can be performed.
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Crane Dale E.
Fairley Christopher R.
Hansen Hans J.
Lee Ken K.
Worster Bruce W.
Hardy David B.
Limanek Robert P.
MacPherson Alan H.
Ultrapointe Corporation
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