Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate
2005-09-13
2005-09-13
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
Having light beams of different frequencies
C356S486000
Reexamination Certificate
active
06943894
ABSTRACT:
A laser distance measuring system has a simple optical structure with which abnormal return light can be removed. The laser distance measuring system includes a laser light source that generates at least two interferable light beams with different frequencies on a same optical axis, a parallel reflecting portion that includes a reflecting surface, which is included in an object that moves along a measurement axis and that is arranged on the measurement axis, and returns an incident light beam in a direction opposite that at which it is incident and at a certain spacing from and parallel to the incident light beam, and an interferometer that is positioned between the laser light source and the parallel reflecting portion and that is arranged on the measurement axis. The optical axes of the light beams are displaced parallel to one another from the measurement axis and one of the light beams is passed through the interferometer and guided to the parallel reflecting portion. The interferometer has a flat reflector that maintains a light path of the light beam that is returned by the parallel reflecting portion.
REFERENCES:
patent: 3597091 (1971-08-01), Bowker
patent: 5305088 (1994-04-01), Hosoe
patent: 5585922 (1996-12-01), Sueyoshi
patent: 5675412 (1997-10-01), Solomon
patent: 5818588 (1998-10-01), Matsumoto et al.
Connolly Patrick
McGinn & Gibb PLLC
Pioneer Corporation
Toatley , Jr. Gregory J.
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