Laser diode with metal-oxide upper cladding layer

Coherent light generators – Particular active media – Semiconductor

Reexamination Certificate

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C438S040000

Reexamination Certificate

active

06990132

ABSTRACT:
A nitride-based laser diode structure utilizing a metal-oxide (e.g., Indium-Tin-Oxide (ITO) or Zinc-Oxide (ZnO)) in place of p-doped AlGaN to form the upper cladding layer. An InGaN laser diode structure utilizes ITO upper cladding structure, with an SiO2isolation structure formed on opposite sides of the ITO upper cladding structure to provide a lateral index step that is large enough to enable lateral single-mode operation. The lateral index step is further increased by slightly etching the GaN:Mg waveguide layer below the SiO2isolation structure. An optional p-type current barrier layer (e.g., AlGaN:Mg having a thickness of approximately20nm) is formed between the InGaN-MQW region and a p-GaN upper waveguide layer to impede electron leakage from the InGaN-MQW region.

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