Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-05-22
2007-05-22
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S184000
Reexamination Certificate
active
10745610
ABSTRACT:
A time for replacement of a laser diode is decided based on a value of operating current of the laser diode and a value of intensity of laser light output from the laser diode.
REFERENCES:
patent: 4792956 (1988-12-01), Kamin
patent: 5163063 (1992-11-01), Yoshikawa et al.
patent: 5936986 (1999-08-01), Cantatore et al.
patent: 2001-92920 (2001-04-01), None
Iwaguchi Isao
Miyazawa Hideo
Ohkawa Masanori
Watanabe Mitsuo
Yamazaki Kozo
Armstrong, Kratz, Quintos Hanson & Brooks, LLP.
Bui Bryan
Fujitsu Frontech Limited
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