Laser diffraction process and apparatus for width...

Optics: measuring and testing – Dimension – Width or diameter

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S559240

Reexamination Certificate

active

07072051

ABSTRACT:
Size distribution of elongated objects is measured by forward scattering radiation from the objects at a range of scatter angles. The scattered radiation is refracted to locations on a scatter detector based on the scatter angles and independent of the location of the objects along the radiation axis. The intensity of radiation is sensed at each position on the scatter detector, and signals representative of the intensities at the positions are processed and compared to masks to identify a size distribution. The scatter detector may include individual radiation detectors arranged to receive refracted radiation representing respective ranges of scatter angles to thereby compensate for lower radiation intensities scattered from smaller objects.

REFERENCES:
patent: 3812376 (1974-05-01), Takeyama et al.
patent: 3953128 (1976-04-01), Holly
patent: 3982816 (1976-09-01), Watkins
patent: 4009965 (1977-03-01), Pryor
patent: 4046536 (1977-09-01), Smithgall, Sr.
patent: 4067651 (1978-01-01), Watkins
patent: 4280827 (1981-07-01), Murphy et al.
patent: 4343637 (1982-08-01), Shofner et al.
patent: 4363827 (1982-12-01), Eichenbaum
patent: 4390897 (1983-06-01), Smithgall, Sr.
patent: 4847509 (1989-07-01), Millet et al.
patent: 4854707 (1989-08-01), Ring et al.
patent: 4880991 (1989-11-01), Boehnlein et al.
patent: 4882497 (1989-11-01), Inoue et al.
patent: 4887155 (1989-12-01), Massen
patent: 5015867 (1991-05-01), Siegel et al.
patent: 5264909 (1993-11-01), Rochester
patent: 5309221 (1994-05-01), Fischer et al.
patent: 5355209 (1994-10-01), Grosso
patent: 5432605 (1995-07-01), Naqwi et al.
patent: 5453837 (1995-09-01), Naqwi et al.
patent: 5513004 (1996-04-01), Naqwi et al.
patent: 6459494 (2002-10-01), Kurokawa et al.
patent: 2002/0044289 (2002-04-01), Blohm et al.
“Fibre Sizing Using Fraunhofer Diffraction” by S.R. Powers et al., inOptics Communications, pp. 313-317, Sep. 1978.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Laser diffraction process and apparatus for width... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Laser diffraction process and apparatus for width..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Laser diffraction process and apparatus for width... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3532471

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.