Laser-based measuring apparatus for measuring an axial...

Details Laser-based measuring apparatus for measuring an axial... Laser-based measuring apparatus for measuring an axial...

2005-10-11

2005-10-11

Turner, Samuel A. (Department: 2877)

Optics: measuring and testing

By light interference

Having light beams of different frequencies

C356S487000

Reexamination Certificate

active

06954273

ABSTRACT:
A laser-based measuring apparatus divides a light beam from a laser light source into at least two light beams, passes the light beams through different optical paths from each other, recombines the light beams, has the light beams interfere with each other to generate interfered light, opto-electrically transduces the interfered light to an optical frequency, and measures the amount of travel of an object which changes an optical path length of a portion of an optical path based on the optical frequency. The measuring apparatus has a portion for generating at least two measuring light beams from the laser light source, two reflection planes included in an object moving on a measuring axis, arranged back-to-back to each other on the measuring axis, and an opposing incident optical system for directing the measuring light beams into the reflection planes, respectively, such that the measuring light beams oppose to each other on the measuring axis.

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Kloos, G., “Design of a Michelson interferometer for the measurement of electrostrictive strains,” Optics & Laser Technology, vol. 28, No. 6, Sep. 1, 1996, pp. 481-484.

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