Laser-based irradiation apparatus and method to measure the...

Details Laser-based irradiation apparatus and method to measure the... Laser-based irradiation apparatus and method to measure the...

2008-05-20

2008-05-20

Epps, Georgia (Department: 2878)

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

C324S501000

Reexamination Certificate

active

07375332

ABSTRACT:
A broad-beam laser irradiation apparatus can measure the parametric or functional response of a semiconductor device to exposure to dose-rate equivalent infrared laser light. Comparisons of dose-rate response from before, during, and after accelerated aging of a device, or from periodic sampling of devices from fielded operational systems can determine if aging has affected the device's overall functionality. The dependence of these changes on equivalent dose-rate pulse intensity and/or duration can be measured with the apparatus. The synchronized introduction of external electrical transients into the device under test can be used to simulate the electrical effects of the surrounding circuitry's response to a radiation exposure while exposing the device to dose-rate equivalent infrared laser light.

REFERENCES:
patent: 5532607 (1996-07-01), Inuzuka
patent: 5754289 (1998-05-01), Ozaki
patent: 6066956 (2000-05-01), Nikawa
patent: 2003/0146761 (2003-08-01), Pakdaman

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