Laser annealer and laser thin-film forming apparatus

Electric heating – Metal heating – By arc

Reexamination Certificate

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Details

C372S006000

Reexamination Certificate

active

07112760

ABSTRACT:
A laser annealer has a laser light source with at least one GaN-type semiconductor laser and is configured so as to form emission points that emit laser beams having a wavelength of 350 to 450 nm, and a scanning device for scanning an annealing surface with the laser beams. The laser annealer may have a spatial light modulator for modulating the laser beams, and in which pixel portions whose light modulating states change in accordance with control signals are arranged on a substrate. The invention is applied to a laser thin-film forming apparatus. The apparatus has a laser source that has at least one semiconductor laser and is configured so as to form emission points, and an optical system for focusing laser beams into a single beam in the width direction of a substrate.

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patent: 2003-84221 (2003-03-01), None
Akito Hara, etA al.,/ Selective Single-Crystalline-Silicon Growth at the Pre-Defined Active Regions ofTFT's on a Glass by a Scanning DPSS CW Laser Irradiation./(Technical Report of IEICE) ED Oct. 2001 pp. 21-27.
Junichi Shida, et al./Poly-Silicon TFT Annealing with XeCI Excimer Laser/Laser Review Jan. 2000.

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