Laser and laser-assisted free electron beam deposition apparatus

Coating processes – Direct application of electrical – magnetic – wave – or... – Pretreatment of coating supply or source outside of primary...

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

427596, 118723EB, 118726, C23C 1400

Patent

active

058493719

ABSTRACT:
A laser and laser-assisted multi-beam deposition apparatus for evaporating and/or sublimating a material to deposit on a substrate comprises using a laser and an electron beam, or two lasers, simultaneously applied to the material to vaporize the material with reduced ejection of material particulates and reduced oxidation of the material. The apparatus and method is particularly useful in the processing of blanket refractory metal depositions on large flat panel display substrates, silicon wafer substrates, and tribological/ceramic coatings.

REFERENCES:
patent: 4152478 (1979-05-01), Takagi
patent: 4281030 (1981-07-01), Silfvast
patent: 4604293 (1986-08-01), Shirahata et al.
patent: 4799454 (1989-01-01), Ito
patent: 4816293 (1989-03-01), Hiramoto et al.
patent: 4836140 (1989-06-01), Koji
patent: 5085166 (1992-02-01), Oka
patent: 5302208 (1994-04-01), Grimm
patent: 5316585 (1994-05-01), Okamoto
patent: 5478398 (1995-12-01), Nakanishi

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Laser and laser-assisted free electron beam deposition apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Laser and laser-assisted free electron beam deposition apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Laser and laser-assisted free electron beam deposition apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1455589

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.