Laser altimeter and probe height sensor

Details Laser altimeter and probe height sensor Laser altimeter and probe height sensor

1981-01-27

1983-02-15

Buczinski, S. C.

Optics: measuring and testing

Range or remote distance finding

With photodetection

356 1, G01C 308, G01C 310, G09B 908

Patent

active

043738052

ABSTRACT:
The disclosure describes an arrangement to measure precisely probe-to-model board distance in a simulator. A source of radiation is positioned to emit a beam toward a model board surface on which a scaled terrain model is constructed. A fixed position lens collects reflected radiation and directs it onto a sensor device which develops an electrical signal indicative of displacement of the reflected beam, which, in turn, varies directly as the distance between the probe and the model board surface. One embodiment describes an arrangement in accordance with the Scheimpflug condition whereby focus is maintained without certain for the depth of field as the probe approaches and withdraws from the surface of the model board.

REFERENCES:
patent: 3520070 (1970-07-01), Gibson
patent: 3631610 (1972-01-01), Cutler
patent: 3914011 (1975-10-01), Mallinson et al.
patent: 4248532 (1981-02-01), Nosler

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