Laser-activated plasma chamber for non-contact testing

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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324 731, 324501, 324537, G01R 3102

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active

052026230

ABSTRACT:
A non-contact testing device for detecting continuity or shorts in conductors of a printed circuit board or integrated circuit employs a laser-activated plasma to make electrical connection between a test probe and a node under test. The plasma is generated in air in a small chamber which is subjected to a concentrated laser pulse, and the plasma exits the chamber due to its self-generated pressure. An electrically-conductive plume of ionized gas (i.e., plasma) is thus used to probe a circuit without making physical contact by a probe. Preferably, the chamber is a conical shape with metallic walls, and the laser pulse is directed into the chamber by a fiber optic cable ending at the large end of the chamber. The plasma exits an orifice at the small end of the conical chamber. The device may be moved about by an X-Y positioning mechanism to probe the circuit under test.

REFERENCES:
patent: 4507605 (1985-03-01), Geisel
patent: 4705329 (1987-11-01), Doemens
patent: 4771230 (1988-09-01), Zeh
patent: 4891578 (1990-01-01), Doemens
patent: 4970461 (1990-11-01), LePage
patent: 5017863 (1991-05-01), Mellitz
patent: 5032788 (1991-07-01), Ringleb et al.

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