Fishing – trapping – and vermin destroying
Patent
1995-06-12
1996-05-14
Thomas, Tom
Fishing, trapping, and vermin destroying
437 35, 437 29, H01L 21265
Patent
active
055167071
ABSTRACT:
A transistor is formed which has improved hot carrier immunity. On a substrate, between two source/drain regions, a gate region is formed over a dielectric region. An implant is used to dope the source/drain regions. After doping the source/drain regions, a tilted angle nitrogen implant is performed to implant nitrogen into areas of the dielectric region overlaying the drain/source regions of the transistor. The tilted angle nitrogen implant may be performed before or after forming spacer regions on sides of the gate region.
REFERENCES:
patent: 5223445 (1993-06-01), Fuse
patent: 5270227 (1993-12-01), Kameyama et al.
patent: 5360749 (1994-11-01), Anjum et al.
H. S. Momose, T. Morimoto, Y. Ozawa, M. Tsuchiaki, M. Ono, K. Yamabe and H. Iwai, Very Lightly Nitrided Oxide Gate MOSFETs for Deep-Submicron CMOS Devices, IEDM Tech. Dig., p. 359, 1991.
S. Kusunoki, M. Inuishi, T. Yamaguchi, K. Tsukamoto and Y. Alasaka, Hot-Carrier-Resistant Structure by Re-Oxidized Nitrided Oxide Sidewall for Highly Reliable and High Performance LDD MOSFETs, IEDM Tech. Digest, p. 649, 1991.
Y. Okada, et al. The Performance and Reliability of 0.4 micron MOSFET's with Gate Oxynitrides Grown by Rapid Thermal Processing Using Mixtures of N.sub.2 O and O.sub.2, Trans. Electron Devices, vol. 41, p. 191, Feb. 1994.
T. Kuroi, et al., Novel NICE (Nitrogen Implantation into CMOS Gate Electrode and Source-Drain) Structure for High Reliability and High Performance 0.25 .mu.m Dual Gate CMOS, IEDM Tech Dig. p. 325, 1993.
Y. Okada, P. Tobin, K. Reid, R. Hegde, B. Maiti and S. Ajuria, Furnace Grown Gate Oxynitride Using Nitric Oxide (NO), Trans. Electron Devices, vol. 41, p. 1608.
Ding Lily
Loh Ying-Tsong
Nowak Edward D.
Gurley Lynne A.
Thomas Tom
VLSI Technology Inc.
Weller Douglas L.
LandOfFree
Large-tilted-angle nitrogen implant into dielectric regions over does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Large-tilted-angle nitrogen implant into dielectric regions over, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Large-tilted-angle nitrogen implant into dielectric regions over will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1895354