Metal working – Method of mechanical manufacture – Electrical device making
Reexamination Certificate
2006-10-03
2006-10-03
Arbes, Carl J. (Department: 3729)
Metal working
Method of mechanical manufacture
Electrical device making
C029S825000, C029S846000, C174S259000
Reexamination Certificate
active
07114252
ABSTRACT:
A plurality of individual circuits are formed on a substrate. Each of the individual circuits is formed with electrical contacts. A spacer is sealed onto the substrate, the spacer peripherally enclosing each of the individual circuits while exposing the conductive contacts. A cover is positioned over the spacer is and integral with it. First conductive feedthroughs penetrate the cover, the first conductive feedthroughs positioned peripheral to each of the individual circuits. Conductive pads are formed on a bottom surface of the cover, the conductive pads in electrical continuity with the conductive contacts of the individual circuits. Conductive paths are formed on the bottom surface of the cover, the conductive paths each joining at least one of the conductive pads with at least one of the first conductive feedthroughs thereby establishing electrical continuity between the individual circuits and the first conductive feedthroughs so as to establish pin-outs.
REFERENCES:
patent: 6060818 (2000-05-01), Ruby et al.
patent: 6377137 (2002-04-01), Ruby
patent: 6384697 (2002-05-01), Ruby
patent: 6399425 (2002-06-01), Brand et al.
patent: 6424237 (2002-07-01), Ruby et al.
patent: 6441702 (2002-08-01), Ella et al.
patent: 6456173 (2002-09-01), Ella et al.
patent: 6469597 (2002-10-01), Ruby et al.
patent: 6472954 (2002-10-01), Ruby et al.
patent: 6480074 (2002-11-01), Kaitila et al.
patent: 6483229 (2002-11-01), Larson, III et al.
patent: 6486751 (2002-11-01), Barber et al.
patent: 6542054 (2003-04-01), Aigner et al.
patent: 6566979 (2003-05-01), Larson, III et al.
patent: 6617249 (2003-09-01), Ruby et al.
patent: 6657517 (2003-12-01), Barber et al.
patent: 6662419 (2003-12-01), Wang et al.
patent: 6711792 (2004-03-01), Itasaka
patent: 6812068 (2004-11-01), Brand et al.
patent: 2003/0098631 (2003-05-01), Ruby et al.
Paper by W. Esashi et all titled “Anodic Bonding for Integrated Capacitive Sensors” a paper in a conference titled IEEE Micro Electro Mechanical Systems: An Investigation of Micro Strucvtures, Sensors, Actuators, Machines and Robots; pp. 43-48.
eds Benecke et al, IEEE, Conference was held Feb. 4-7, 1992 in Travemunde, Germany.
Nakanishi Keiichi
Tanielian Aram
Tanielian Garo W.
Arbes Carl J.
Gene Scott & Patent Law & Venture Group
Toko Inc.
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