Large integrated circuit with modulator probe structures

Details Large integrated circuit with modulator probe structures Large integrated circuit with modulator probe structures

1996-09-20

1998-10-20

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, G01R 3128

Patent

active

058251944

ABSTRACT:
A method of testing a large integrated circuit (10) of modular design. Test equipment is connected to a dedicated testing pad section (20) for each circuit section (22, 24, 34) of each module (12, 14, 16). The circuit section under test is tested via the testing pad adjacent that circuit section. The test equipment is then stepped to the testing section for the next circuit section. When testing is completed, the testing section is then electrically isolated from the circuit sections to prevent interference with operation of the entire circuit (10).

REFERENCES:
patent: 4244048 (1981-01-01), Tsui
patent: 4956602 (1990-09-01), Parrish
patent: 4961053 (1990-10-01), Krug
patent: 5214655 (1993-05-01), Eichelberger et al.

Affiliated with

Also associated with

Rating

Large integrated circuit with modulator probe structures does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Large integrated circuit with modulator probe structures, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Large integrated circuit with modulator probe structures will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-248315