Large integrated circuit with modular probe structures

Details Large integrated circuit with modular probe structures Large integrated circuit with modular probe structures

1994-11-30

1997-07-15

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, 371 225, G01R 3128

Patent

active

056487304

ABSTRACT:
A large integrated circuit (10) of modular design, each module (12,14,16) having a circuit section (22,24,34) and a separate dedicated testing pad section (20). Each circuit module (12,14,16) can be individually functionally tested as an independent circuit with conventional prober equipment for defects. Each testing pad section (20) facilitates controlling the entire integrated circuit (10) so that the respective module circuit section (12,14,16) can be tested. Control circuitry (26) comprised of pass gates is provided to isolate the testing pad sections (20) from the operational portion (22,24,34) of the integrated circuit (10) when not under test. The present invention is ideally suited for large spatial light modulators, memory devices and other large sophisticated integrated circuits.

REFERENCES:
patent: 4550289 (1985-10-01), Kabashima et al.
patent: 4687989 (1987-08-01), Davis et al.
patent: 4701921 (1987-10-01), Powell et al.
patent: 4710931 (1987-12-01), Bellay et al.
patent: 4744061 (1988-05-01), Takemae et al.
patent: 4970454 (1990-11-01), Stambaugh et al.
patent: 5008727 (1991-04-01), Katsura et al.
patent: 5051996 (1991-09-01), Bergson et al.
patent: 5061049 (1991-10-01), Hornbeck
patent: 5079544 (1992-01-01), DeMond et al.
patent: 5105369 (1992-04-01), Nelson
patent: 5107208 (1992-04-01), Lee
patent: 5187712 (1993-02-01), Malleo-Roach et al.
patent: 5357193 (1994-10-01), Tanaka et al.
patent: 5391501 (1995-02-01), Usami et al.

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