Glass manufacturing – Processes of manufacturing fibers – filaments – or preforms – With measuring – controlling – sensing – programming – timing,...
Patent
1993-04-30
1994-12-13
Jones, W. Gary
Glass manufacturing
Processes of manufacturing fibers, filaments, or preforms
With measuring, controlling, sensing, programming, timing,...
65 606, 65 601, 65 29, 65425, 65430, 324636, 324635, 427 9, 427 10, C03B 3710
Patent
active
053726227
ABSTRACT:
Described is a new method and apparatus for measuring the thickness of a thin conductive coating deposited on a moving elongated dielectric body. Of special use is an application of a carbon coating on an optical fiber. The thickness of the conductive coating is measured by establishing an electromagnetic field in a resonator including an elongated unshielded helix and a pair of coupling loops. The helix is suspended between the coupling loops out of contact with either one of them. An electromagnetic energy is coupled into one loop as an input signal from a source of electromagnetic energy and coupled out from the other loop as an output signal. The difference between the magnitude of energy of an empty helix or of a helix with an uncoated body, and the helix with a coated body, is used for controlling the coating process. The inner diameter of the helix is large relative to the diameter of the elongated body being at least five times the diameter of the fiber and the spacing between the coils of the helix being equal to the cross-sectional dimension of the rod, wire or tubing making up the coil. The general principles stated herein can be applied over a wide range of radio frequencies, typically from about 100 MHz to 100 GHz, and can be applied to a wide range of coating configurations by appropriately selecting a frequency range and equipment that is compatible with the selected frequency range.
REFERENCES:
patent: 3936738 (1976-02-01), Maltby
patent: 4530750 (1985-07-01), Aisenberg
patent: 5000541 (1991-03-01), DiMarcello et al.
patent: 5013130 (1991-05-01), Atkins et al.
patent: 5021072 (1991-06-01), Atkins
patent: 5057781 (1991-10-01), Akins et al.
patent: 5194815 (1993-03-01), Maeno
patent: 5241279 (1993-08-01), Boniort
patent: 5281247 (1994-01-01), Aikawa
patent: 5296011 (1994-03-01), Aikawa
A New technique of Deformation Measurements Based on Microwave Resonate cavities, Besada, J. Lo et al, Sep./ 1980 Microwave Conference Warsaw Poland, pp. 288-292.
J. Y. Boniort, et al. "New Characterisation Techniques for Hermetic Carbon Coated Fibers", ECOC-100C91, Paris, France.
Atkins Robert M.
Peterson George E.
Alber Oleg E.
AT&T Corp.
Hoffmann John
Jones W. Gary
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