Lapping monitor device, system and method

Details Lapping monitor device, system and method Lapping monitor device, system and method

2007-10-30

2007-10-30

Tugbang, A. Dexter (Department: 3729)

Metal working

Means to assemble or disassemble

Means to assemble electrical device

C029S603120, C451S001000, C451S005000, C451S041000, C360S313000

Reexamination Certificate

active

10195106

ABSTRACT:
A lapping monitor element that is juxtaposed with a magnetic transducer element having a magnetoresistance effect film to determine the lapping position upon lapping the element height of the magnetic transducer element to a predetermined dimension. The lapping monitor element includes a resistance film to be resistance measured. The resistance film is a metal film of nonmagnetic transition metal or of alloy composed mainly of nonmagnetic transition metal, or a multilayered film where two or more such metal films are laid one upon another. The lapping monitor makes it possible to extremely stabilize the ELG sensor resistance measured values upon lapping as well as to provide a high accuracy MR height control.

REFERENCES:
patent: 4489484 (1984-12-01), Lee
patent: 4592921 (1986-06-01), Hieber et al.
patent: 5514469 (1996-05-01), Shinjo et al.
patent: 6170149 (2001-01-01), Oshiki et al.
patent: 02-301010 (1990-12-01), None
patent: 10-289413 (1998-10-01), None
patent: 2003-46163 (2003-02-01), None

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