Land appearance inspecting device, and land appearance...

Details Land appearance inspecting device, and land appearance... Land appearance inspecting device, and land appearance...

2007-07-31

2007-07-31

Ahmed, Samir (Department: 2624)

Image analysis

Applications

Seismic or geological sample measuring

C382S147000

Reexamination Certificate

active

10471834

ABSTRACT:
Land circle calculating means (7) calculates a land circle as an approximate circle from label information (S6). Land circle accuracy-enhancing means (8) calculates again the land circle by changing a mask angle if land circle candidate information (S7) obtained is improper, so as to enhance the accuracy of the land circle. AND operation means (11) carries out an AND operation of a land circle image (S9) and a binary image (S10) to create a land missing image (S11). In-land binary means (12) calculates an in-land defect image (S12) from an original image (S4). OR operation means (13) carries out an OR operation of the in-land missing image (S11) and the in-land defect image (S12) to create a land defect image (S13).

REFERENCES:
patent: 5161202 (1992-11-01), Kitakado et al.
patent: 6278797 (2001-08-01), Nagasaki et al.
patent: 2502853 (1996-03-01), None
patent: 2502854 (1996-03-01), None
patent: 9-203620 (1997-08-01), None
patent: 2888829 (1999-02-01), None

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