Lamp annealer and method for annealing semiconductor wafer

Electric heating – Heating devices – Combined with container – enclosure – or support for material...

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Details

392416, 118724, 118725, F27B 514

Patent

active

061215805

ABSTRACT:
A lamp annealer for heating and annealing product wafers loaded into a chamber by a lamp means. The lamp annealer comprises a first chamber for loading product wafers, a second chamber disposed adjacent to the first chamber for loading only a dummy wafer, a pyrometer means for measuring a temperature of a wafer in the first chamber and a temperature of a wafer in the second chamber, and a lamp means for heating the wafer in the first chamber and the wafer in the second chamber. Periodically, dummy wafers are loaded into the first and second chambers, temperatures of the dummy wafer in the first chamber and the dummy wafer in the second chamber which are both heated by the lamp means are measured by the pyrometer means, and, when product wafers are annealed, intensity of light of the lamp is compensated based on a difference between the temperatures.

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