X-ray or gamma ray systems or devices – Specific application – Tomography
Patent
1990-08-30
1993-11-02
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Tomography
378137, 378 25, 378 22, A61B 600
Patent
active
052590127
ABSTRACT:
A tomographic inspection system which enables multiple locations within an object to be imaged without mechanical movement of the object. The object is interposed between a rotating X-ray source and a synchronized rotating detector. A focal plane within the object is imaged onto the detector so that a cross-sectional image of the object is produced. The X-ray source is produced by deflecting an electron beam onto a target anode. The target anode emits X-ray radiation where the electrons are incident upon the target. The electron beam is produced by an electron gun which includes X and Y deflection coils for deflecting the electron beam in the X and Y directions. Deflection voltage signals are applied to the X and Y deflection coils and cause the X-ray source to rotate in a circular trace path. An additional DC voltage applied to the X or Y deflection coil will cause the circular path traced by the X-ray source to shift in the X or Y direction by a distance proportional to the magnitude of the DC voltage. This causes a different field of view, which is displaced in the X or Y direction from the previously imaged region, to be imaged. Changes in the radius of the X-ray source path result in a change in the Z level of the imaged focal plane.
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Adams John A.
Baker Bruce D.
Corey Robert L.
Chu Kim-Kwok
Epperson Dennis H.
Four PI Systems Corporation
Porta David P.
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