Laminated contact probe for inspection of ultra-microscopic pitc

Details Laminated contact probe for inspection of ultra-microscopic pitc Laminated contact probe for inspection of ultra-microscopic pitc

1997-10-01

2000-03-07

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 106

Patent

active

060345349

ABSTRACT:
There is provided a laminated contact probe for use in a high frequency region for inspection of an ultra-microscopic pitch of a plurality of contact probe plates. The contact probe plate is sandwiched with the ground plates with insulating material between the contact probe plate(s) and the ground plates. Each of the contact probes and the ground plates is formed with an ultra-thin plate. The contact probe has an elongated segment portion extending from the needle portion, the elongated segment portion being provided by forming a cut on the ultra-thin plate backward the needle portion, so that the needle portion is movable on an elastic basis in a direction perpendicularly intersecting to a direction of the cut.

REFERENCES:
patent: 3611128 (1971-10-01), Nagata
patent: 4035723 (1977-07-01), Kvaternik
patent: 4045737 (1977-08-01), Coberly

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