Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2005-08-08
2010-02-09
Dunn, Drew A (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
Reexamination Certificate
active
07660699
ABSTRACT:
A method for determining whether a first group of a product, a component or a system in reliability life testing has longer lifetime than a second group. This method is non-parametric and free from a pre-assumption of statistical distributions and can be applied to all kinds of data and distributions. Errors from goodness-of-fit of distribution fitting and parameter estimations are thus eliminated. After pre-check on bimodal, early failures, and the failure mechanisms, the method employs numerical solutions with good accuracy by the nonparametric approach. The data under consideration can be censored, interval or bimodal, and not limited to simple cases of complete type. The method can be used to determine multiplicities of reliability tests for all product types and at all levels. Based on a comparability index derived from integrating the weighted difference between the reliability functions of the two groups under comparison. Several indices are proposed for effectiveness of reliability comparability.
REFERENCES:
patent: 6611029 (2003-08-01), Ahmed et al.
patent: 6657252 (2003-12-01), Fried et al.
patent: 6789031 (2004-09-01), Wang
patent: 7136776 (2006-11-01), Eichblatt et al.
Bain et al., Statistical Analysis of Reliability and Life-Testing Models: Theory and Methods, Marcel Dekker, Inc., 1991, pp. 42-89.
Kececioglu, Reliability and Life Testing Handbook, vol. 1, PTR Prentice Hall, 1993, pp. 525-565.
Nelson, Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, John Wiley & Sons, 1990, pp. 425-450.
Chien Wei-Ting Kary
Yang Siyuan
Cherry Stephen J
Dunn Drew A
Semiconductor Manufacturing International (Shanghai) Corporation
Townsend and Townsend / and Crew LLP
LandOfFree
Knowledge-based statistical method and system to determine... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Knowledge-based statistical method and system to determine..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Knowledge-based statistical method and system to determine... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4216579