Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-09-14
2010-02-09
Nguyen, Vinh P (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090
Reexamination Certificate
active
07659739
ABSTRACT:
An improved knee probe for probing electrical devices and circuits is provided. The improved knee probe has a reduced thickness section to alter the mechanical behavior of the probe when contact is made. The reduced thickness section of the probe makes it easier to deflect the probe vertically when contact is made. This increased ease of vertical deflection tends to reduce the horizontal contact force component responsible for the scrub motion, thereby decreasing scrub length. Here “thickness” is the probe thickness in the deflection plane of the probe (i.e., the plane in which the probe knee lies). The reduced thickness probe section provides increased design flexibility for controlling scrub motion, especially in combination with other probe parameters affecting the scrub motion.
REFERENCES:
patent: 3518612 (1970-06-01), Dunman et al.
patent: 3599093 (1971-08-01), Oates
patent: 3710251 (1973-01-01), Hagge et al.
patent: 3812311 (1974-05-01), Kvaternik
patent: 4027935 (1977-06-01), Byrnes et al.
patent: 4115736 (1978-09-01), Tracy
patent: 4116523 (1978-09-01), Coberly et al.
patent: 4423376 (1983-12-01), Byrnes et al.
patent: 4525697 (1985-06-01), Jones et al.
patent: 4532423 (1985-07-01), Tojo et al.
patent: 4593961 (1986-06-01), Cosmo
patent: 4618767 (1986-10-01), Smith et al.
patent: 4618821 (1986-10-01), Lenz
patent: 4706019 (1987-11-01), Richardson
patent: 4730158 (1988-03-01), Kasai et al.
patent: 4747698 (1988-05-01), Wickramasinghe et al.
patent: 4757255 (1988-07-01), Margozzi
patent: 4772846 (1988-09-01), Reeds
patent: 4773877 (1988-09-01), Kruger et al.
patent: 4807159 (1989-02-01), Komatsu et al.
patent: 4901013 (1990-02-01), Benedetto et al.
patent: 4967148 (1990-10-01), Doemens et al.
patent: 5015947 (1991-05-01), Chism
patent: 5026291 (1991-06-01), David
patent: 5030318 (1991-07-01), Reche
patent: 5145384 (1992-09-01), Asakawa et al.
patent: 5205739 (1993-04-01), Malo et al.
patent: 5207585 (1993-05-01), Byrnes
patent: 5230632 (1993-07-01), Baumberger et al.
patent: 5354205 (1994-10-01), Feigenbaum et al.
patent: 5422574 (1995-06-01), Kister
patent: 5430614 (1995-07-01), Difrancesco
patent: 5436571 (1995-07-01), Karasawa
patent: 5531022 (1996-07-01), Beaman et al.
patent: 5576631 (1996-11-01), Stowers et al.
patent: 5632631 (1997-05-01), Fjelstad et al.
patent: 5635846 (1997-06-01), Beaman et al.
patent: 5644249 (1997-07-01), Kister
patent: 5676599 (1997-10-01), Ricks et al.
patent: 5720098 (1998-02-01), Kister
patent: 5742174 (1998-04-01), Kister et al.
patent: 5751157 (1998-05-01), Kister
patent: 5764070 (1998-06-01), Pedder
patent: 5764072 (1998-06-01), Kister
patent: 5764409 (1998-06-01), Colvin
patent: 5767691 (1998-06-01), Verkuil
patent: 5773987 (1998-06-01), Montoya
patent: 5802699 (1998-09-01), Fjelstad et al.
patent: 5806181 (1998-09-01), Khandros et al.
patent: 5832601 (1998-11-01), Eldridge et al.
patent: 5884395 (1999-03-01), Dabrowiecki et al.
patent: 5892539 (1999-04-01), Colvin
patent: 5914613 (1999-06-01), Gleason et al.
patent: 5917707 (1999-06-01), Khandros et al.
patent: 5923178 (1999-07-01), Higgins et al.
patent: 5932323 (1999-08-01), Throssel
patent: 5934914 (1999-08-01), Fjelstad et al.
patent: 5936421 (1999-08-01), Stowers et al.
patent: 5945836 (1999-08-01), Sayre et al.
patent: 5952843 (1999-09-01), Vinh
patent: 5970167 (1999-10-01), Colvin
patent: 6027630 (2000-02-01), Cohen
patent: 6064215 (2000-05-01), Kister
patent: 6071630 (2000-06-01), Tomaru et al.
patent: 6086386 (2000-07-01), Fjelstad et al.
patent: 6133072 (2000-10-01), Fjelstad
patent: 6204674 (2001-03-01), Dabrowiecki
patent: 6205660 (2001-03-01), Fjelstad et al.
patent: 6218203 (2001-04-01), Khoury et al.
patent: 6246245 (2001-06-01), Akram et al.
patent: 6247228 (2001-06-01), Distefano et al.
patent: 6278284 (2001-08-01), Mori et al.
patent: 6292003 (2001-09-01), Fredrickson et al.
patent: 6344753 (2002-02-01), Takada et al.
patent: 6411112 (2002-06-01), Das et al.
patent: 6419500 (2002-07-01), Kister
patent: 6420887 (2002-07-01), Kister et al.
patent: 6424164 (2002-07-01), Kister
patent: 6433571 (2002-08-01), Montoya
patent: 6441315 (2002-08-01), Eldridge et al.
patent: 6443784 (2002-09-01), Kimoto
patent: 6482013 (2002-11-01), Eldridge et al.
patent: 6486689 (2002-11-01), Nishikawa
patent: 6525552 (2003-02-01), Kister
patent: 6529021 (2003-03-01), Yu
patent: 6530148 (2003-03-01), Kister
patent: 6570396 (2003-05-01), Kister
patent: 6573738 (2003-06-01), Matsuo et al.
patent: 6575767 (2003-06-01), Satoh et al.
patent: 6576485 (2003-06-01), Zhou et al.
patent: 6633176 (2003-10-01), Takemoto et al.
patent: 6677245 (2004-01-01), Zhou et al.
patent: 6707311 (2004-03-01), Hohenwarter
patent: 6727719 (2004-04-01), Liao et al.
patent: 6731123 (2004-05-01), Kimoto
patent: 6765228 (2004-07-01), Lin et al.
patent: 6842023 (2005-01-01), Yoshida et al.
patent: 6847221 (2005-01-01), Kimoto et al.
patent: 6853208 (2005-02-01), Okubo et al.
patent: 6890185 (2005-05-01), Kister et al.
patent: D507198 (2005-07-01), Kister
patent: 6917525 (2005-07-01), Mok et al.
patent: D510043 (2005-09-01), Kister
patent: 6956389 (2005-10-01), Mai
patent: 6965245 (2005-11-01), Kister et al.
patent: 6970005 (2005-11-01), Rincon
patent: 7015707 (2006-03-01), Cherian
patent: 7046021 (2006-05-01), Kister
patent: 7059865 (2006-06-01), Kister et al.
patent: 7064564 (2006-06-01), Kister et al.
patent: D525207 (2006-07-01), Kister et al.
patent: 7078921 (2006-07-01), Haga et al.
patent: 7091729 (2006-08-01), Kister
patent: 7109731 (2006-09-01), Gleason et al.
patent: 7148709 (2006-12-01), Kister
patent: 7150658 (2006-12-01), Chien
patent: 7202682 (2007-04-01), Cooper et al.
patent: 7218127 (2007-05-01), Cooper et al.
patent: 7218131 (2007-05-01), Tanioka et al.
patent: 7265565 (2007-09-01), Chen et al.
patent: 7274195 (2007-09-01), Takemoto et al.
patent: 7285966 (2007-10-01), Lee et al.
patent: 7436192 (2008-10-01), Kister
patent: 7511523 (2009-03-01), Chen et al.
patent: 2002/0070743 (2002-06-01), Felici et al.
patent: 2002/0153913 (2002-10-01), Okubo et al.
patent: 2004/0104737 (2004-06-01), Haga et al.
patent: 2004/0119485 (2004-06-01), Koch et al.
patent: 2004/0239352 (2004-12-01), Mizoguchi
patent: 2005/0179458 (2005-08-01), Chen et al.
patent: 2005/0189955 (2005-09-01), Takemoto et al.
patent: 2006/0073712 (2006-04-01), Suhir
patent: 2006/0082380 (2006-04-01), Tanioka et al.
patent: 2006/0170440 (2006-08-01), Sudin
patent: 2006/0171425 (2006-08-01), Lee et al.
patent: 2007/0167022 (2007-07-01), Tsai et al.
patent: 0764352 (2004-05-01), None
patent: 11241690 (1999-09-01), None
patent: WO 8704568 (1987-07-01), None
patent: WO 96/15458 (1996-05-01), None
Sporck, Nicholas, “A New Probe Card Technology Using Compliant Microsprings”,Proceedings 1997 IEEE International Test ConferenceNov. 1, 1997, pp. 527-532.
Lodenkamper Robert
Micro Porbe, Inc.
Nguyen Vinh P
Oeacock Deborah A.
Updegraff Samantha A.
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