Optics: measuring and testing – By alignment in lateral direction
Patent
1994-12-22
1996-11-12
Gonzalez, Frank
Optics: measuring and testing
By alignment in lateral direction
356400, 22818021, 361760, G01B 1100
Patent
active
055745610
ABSTRACT:
The present invention relates to a novel, accurate, passive alignment of optical and optoelectronic elements using silicon waferboard technology. The invention particularly relates to the use of etched v-grooves on monocrystalline materials in conjunction with alignment spheres to effect the passive alignment.
REFERENCES:
patent: 4210923 (1980-07-01), North et al.
patent: 4288808 (1981-09-01), Hantusch
patent: 4565314 (1986-01-01), Scholz
patent: 5123073 (1992-06-01), Pimpinella
patent: 5329423 (1994-07-01), Scholz
Boudreau Robert A.
Han Hongtao
Kadar-Kallen Michael
Rowlette, Sr. John R.
Francos W. S.
Gonzalez Frank
Kun Robert
The Whitaker Corporation
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