Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-12-31
2000-05-30
Ballato, Josie
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324758, G01R 3128
Patent
active
060694807
ABSTRACT:
A device (10) for testing miniature electronic components (104) includes a pair of contacts (88, 90), each of which is adapted to engage a common side (121) of a lead (110) of the electronic component (104) to be tested at longitudinally spaced locations. In particular, each contact (88, 90) includes an end portion (95, 99) that is arranged at an angle to both the lead (110) and the other contact (88, 90), while extending in a common vertical plane with the other contact (88, 90). In a preferred form of the invention, the device (10) includes a base (46) to which the first and second contacts (88, 90) are mounted. Each of the contacts (88, 90) include first and second end portions (94, 95 and 98, 99), with the first end portion (94, 98) of each contact (88, 90) being fixed relative to the base (46) and the second end portion (95, 99) extending at an angle to a plane of the base (46). In the most preferred form, the first end portion (94) of the first contact (88) is mounted atop the base (46) and the second end portion (95) thereof slopes downward from the base (46). On the other hand, the second end portion (99) of the second contact (90) is mounted below the first contact (88), such as on the bottom of the base (46), and the second end portion (99) thereof projects upwardly, at an acute angle to the vertical, to a point located above the second end portion (95) of the first contact (88). To accommodate the testing of electronic components (104) having varying lead spans, the base (46) can be formed from multiple, relatively shiftable sections (46a, 46b), each of which carries a respective pair of contact (88, 90).
REFERENCES:
patent: 4047780 (1977-09-01), Cedrone
patent: 4308498 (1981-12-01), Madajewski et al.
patent: 4316231 (1982-02-01), Michel
patent: 4410227 (1983-10-01), Prunella et al.
patent: 4419626 (1983-12-01), Cedrone et al.
patent: 4747784 (1988-05-01), Cedrone
patent: 4866374 (1989-09-01), Cedrone
patent: 4956604 (1990-09-01), Cedrone
patent: 5521521 (1996-05-01), Perego
patent: 5731709 (1998-03-01), Pastore et al.
Rowan Martin
Sabounchi Farid J.
Schultz Kurt
Aetrium-FSA, LP
Ballato Josie
Sundaram T. R.
LandOfFree
Kelvin contact-type testing device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Kelvin contact-type testing device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Kelvin contact-type testing device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1912868