Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2008-02-20
2011-12-27
Bhat, Aditya (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
Reexamination Certificate
active
08086420
ABSTRACT:
A method and apparatus for predicting junction device temperature of at least a first switching device in a power conversion module that includes a plurality of switching devices, the method comprising the steps of, during switching activity, identifying at least one operating characteristic of the first switching device and solving an equation that uses the identified operating characteristic to predict the temperature of the first switching device where the equation solved is a function of the location of the first switching device with respect to the other switching devices in the plurality.
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Brown Brian P.
Gollhardt Neil
Kerkman Russel J.
Lukaszewski Richard A.
Wei Lixiang
Bhat Aditya
Kuszewski Alexander R.
Miller John M.
Quarles & Brady LLP
Rockwell Automation Technologies Inc.
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