JTAG component description via nonvolatile memory

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395575, G01R 3128

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active

053253680

ABSTRACT:
Nonvolatile memory is provided on each module of a computer system including one or more modules with each module including a plurality of components including JTAG technology. A test bus operable in accordance with the 1149.1 standard is included in the computer system and is arranged to access the nonvolatile memory. Boundary scan information for the components on a module and also additional information, preferably fully describing all JTAG related characteristics and operations, is stored in the nonvolatile memory. A JTAG bus system is then able to access the module memory and obtain all information required to fully implement JTAG operations for the module.

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IEEE Standard Test Access Port and Boundary-Scan Architecture, IEEE Std 1149.1--1990, May 21, 1990.
The Wall Street Journal, Sep. 19, 1990 Edition, Advertisement, pp. A16-A17.

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