Jitter resistance measuring instrument and method for...

Pulse or digital communications – Testing – Phase error or phase jitter

Reexamination Certificate

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C375S224000, C375S371000

Reexamination Certificate

active

10362352

ABSTRACT:
A control section varies an amplitude of a modulation signal every time the control section conducts control to vary a combination of the frequency of a clock signal and the frequency of the modulation signal by controlling a clock signal generator and a modulation signal generator, and derives a value indicating jitter tolerance of a measurement subject based on a decision result on an error of a data signal having a predetermined pattern output from the measurement subject and information of the amplitude of the modulation signal. A display section receives information concerning the frequency of the clock signal, the frequency of the modulation signal, and the amplitude of the modulation signal, and the value indicating jitter tolerance, and displays jitter tolerance characteristics of the measurement subject simultaneously on a screen by using the frequency of the clock signal and the frequency of the modulation signal as two parameters.

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Christensen, “A comparison of ITU-T and FC/GE jitter methodology applied to jitter tolerance and eye opening measurements on high-speed CDRs” IEEE P802.3ae 10Gb/s Ethernet Task Force Jitter Documents Feb. 22, 2001.
ITU-T Telecommunication Standarization Sector of ITU; 0.171; Series O: Specifications of Measuring Equipment; Apr. 1997; pp. 1-28.
Hewlett-Packard Application Note 1267: “Frequency agile jitter measurement system,” Hewlett-Packard, Internet Citation, Apr. 1995, Retrieved from the Internet: URL/http://www.tm.agilent.com/classes/MasterServlet?view=applicationnote&apn-ItemID-1000000272&1language=eng&locale=US>, XP-002186891, H04I1/20g, pp. 1-25.
Miller, C.T., et al: “Jitter Analysis of High-Speed Digital Systems”, Hewlett-Packard Journal, Hewlett-Packard Co. Palo Alto, US, vol. 46, No. 1, Feb. 1, 1995, pp. 49-56, XP000502761.

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