Data processing: measuring – calibrating – or testing – Measurement system – Speed
Reexamination Certificate
2005-08-16
2005-08-16
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Speed
Reexamination Certificate
active
06931349
ABSTRACT:
In a system and method for measuring total litter in a high speed data processing device, a high-speed data processing device, as an object under test, receives test data and generates differential output data at a high rate. A test device provides the test data to the high speed data processing device and provides a comparison operation reference clock. A high-speed differential comparator is coupled between the high speed data processing device and the test device for comparing the differential output data of the high speed data processing device in response to the comparison operation reference clock. In this manner, measurement of total jitter in a high speed data processing device can be achieved rapidly and without the need for employing a high-cost measuring instrument.
REFERENCES:
patent: 4329654 (1982-05-01), Chamberlain
patent: 5578935 (1996-11-01), Burns
patent: 5589763 (1996-12-01), Burns
patent: 5740086 (1998-04-01), Komoto
patent: 5768155 (1998-06-01), Becker
patent: 5923706 (1999-07-01), März
patent: 6185510 (2001-02-01), Inoue
patent: 2003/0020459 (2003-01-01), Lambert
Lau Tung S.
Mills & Onello LLP
LandOfFree
Jitter measuring system in high speed data output device and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Jitter measuring system in high speed data output device and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Jitter measuring system in high speed data output device and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3520860