Jitter measurement method, jitter measuring apparatus and...

Details Jitter measurement method, jitter measuring apparatus and... Jitter measurement method, jitter measuring apparatus and...

2005-08-01

2008-12-23

Lau, Tung S (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C250S235000, C358S481000, C347S111000, C356S608000

Reexamination Certificate

active

07469191

ABSTRACT:
The present invention measures jitter in a galvano scanner that scans a light beam on a surface to be scanned by periodically turning a reflection mirror in a reciprocating manner. Two detectors for detecting and receiving the light beam are mounted near both ends of the scan region of the light beam, a first detection signal of each of the two detectors is extracted whenever the reflection mirror is activated for one scanning, a required time for one scanning is computed from the extracted detection signals, and a variation in the required time for each scanning is measured based on the computed required time.

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