Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Phase comparison
Patent
1989-04-07
1990-12-04
Williams, Herzon E.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Phase comparison
G01R 2500
Patent
active
049756346
ABSTRACT:
Jitter is measured by applying a first clock signal to a device-under-test, measuring the phase difference between the jittered clock signal received from the device-under-test and a reference clock signal, and converting the phase difference to a jitter measurement. The phase difference is measured by counting the number of high frequency clock pulses between a transition of the jittered clock signal and a transition of the reference clock signal. The phase difference is converted to a jitter measurement by determining the highest and lowest phase difference count and taking the difference between the highest and lowest count. The phase of the reference clock signal can be adjusted as a function of the highest and lowest count by determined the mean value of the highest and lowest count and adjusting the reference clock to be of this mean value. The range of the jitter measurement can be adjusted by adjusting the frequency of high frequency clock to the counter, the jittered signal received from the device-under-test and the reference clock signal.
REFERENCES:
patent: 3737766 (1978-06-01), Lubarsky, Jr.
patent: 3820022 (1974-06-01), Watt
patent: 4412299 (1983-10-01), Huffman
patent: 4654586 (1987-03-01), Evans, Jr. et al.
patent: 4819080 (1989-04-01), Cucchietti et al.
"DS3 Jitter Measurements with the S5200 D", Tau-Tron, Inc. Application Note, AN-1, Dec. 1982.
"DS1, DS1C, DS2 and DS3 Error Measurement and Monitoring", Tau-Tron, Inc. Application Note, AN-7, Oct. 1983.
"Jiller, WJITS and Digital Transmission Systems", Tau-Tron, Inc., Application Note, AN-8, Jan. 1984.
"Eye Diagram Measurments on Sampling Oscilloscope", Tau-Tron, Inc., The Pulse, by Philip Gendron (vol. IV, reprint).
"Jitter in Digital Transmission systems", Tau-Tron, Inc., Technical Note, by William W. Rollins.
Error Second Measurements as Performance Indications for Digital Tramsmission Systems, by William Rollins (Tau-Tron, Inc.).
Arana Louis M.
General Signal Corporation
Williams Herzon E.
LandOfFree
Jitter measurement device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Jitter measurement device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Jitter measurement device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-885083